
KLA designs and manufactures yield-management and process-monitoring diagnostic and control systems for the semiconductor industry. The systems are used to analyze the manufacturing process at various steps in a semiconductor's development. The firm's laser-scanning products are used for wafer quali... KLA designs and manufactures yield-management and process-monitoring diagnostic and control systems for the semiconductor industry. The systems are used to analyze the manufacturing process at various steps in a semiconductor's development. The firm's laser-scanning products are used for wafer qualification, process monitoring, and equipment monitoring. KLA also provides inspection tools and systems for optical metrology and e-beam metrology. Show more
Période | Variation | Variation % | Ouver. | Haut | Bas | Moyenne Vol. Quot. | VWAP | |
---|---|---|---|---|---|---|---|---|
1 | -35.79 | -5.11278410308 | 700.01 | 717.24 | 653.7392 | 1100233 | 691.00789352 | CS |
4 | -77.76 | -10.4800668482 | 741.98 | 794 | 653.7392 | 1053496 | 722.04073368 | CS |
12 | 6 | 0.911549330011 | 658.22 | 794 | 613.4 | 1112360 | 709.65292935 | CS |
26 | -70.635 | -9.61210034633 | 734.855 | 832.9987 | 609.4 | 1100129 | 697.13442627 | CS |
52 | -27.23 | -3.93810109191 | 691.45 | 894.77 | 609.4 | 994562 | 721.46103215 | CS |
156 | 339.99 | 104.860747001 | 324.23 | 894.77 | 250.2 | 1152015 | 498.12283645 | CS |
260 | 529.82 | 394.211309524 | 134.4 | 894.77 | 110.19 | 1193863 | 404.4447264 | CS |
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