KLA designs and manufactures yield-management and process-monitoring diagnostic and control systems for the semiconductor industry. The systems are used to analyze the manufacturing process at various steps in a semiconductor's development. The firm's laser-scanning products are used for wafer quali... KLA designs and manufactures yield-management and process-monitoring diagnostic and control systems for the semiconductor industry. The systems are used to analyze the manufacturing process at various steps in a semiconductor's development. The firm's laser-scanning products are used for wafer qualification, process monitoring, and equipment monitoring. KLA also provides inspection tools and systems for optical metrology and e-beam metrology. Show more
Période | Variation | Variation % | Ouver. | Haut | Bas | Moyenne Vol. Quot. | VWAP | |
---|---|---|---|---|---|---|---|---|
1 | 29.57 | 4.8062544698 | 615.24 | 653.89 | 613.4 | 1025480 | 637.25741552 | CS |
4 | 0 | 0 | 644.81 | 669.095 | 613.4 | 1110206 | 647.83813155 | CS |
12 | -148.215 | -18.6898269285 | 793.025 | 832.9987 | 609.4 | 1156047 | 666.49933368 | CS |
26 | -174.66 | -21.3137759772 | 819.47 | 894.77 | 609.4 | 1037005 | 719.98632658 | CS |
52 | 51.54 | 8.68744416539 | 593.27 | 894.77 | 542.41 | 969751 | 702.7351518 | CS |
156 | 222.58 | 52.7153447173 | 422.23 | 894.77 | 250.2 | 1180028 | 474.19467655 | CS |
260 | 465.56 | 259.726638773 | 179.25 | 894.77 | 110.19 | 1210149 | 381.17084888 | CS |
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